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Wright Center for Photovoltaics Innovation and Commercialization

PVIC Services and Pricing

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The Photovoltaic Innovation and Commercialization (PVIC) center offers solar innovators a full spectrum of development services provided by leading vendors in equipment, engineering, testing, failure analysis and certification and other services need to bring PV products to market.Ìý

The listing of capabilities is a result a suite of advanced instrumentation and capabilities for photovoltaics research and development has been established at UT with support from the U.S. Air Force, NASA, the U.S. Department of Energy and Ohio's Third Frontier Program.

Fabrication Services /Ìý Pricing
Metrology ServicesÌý /Ìý Pricing
Solar Panel TestingÌý ServicesÌý /Ìý Pricing

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Contact – Adam Phillips, Adam.Phillips@utoledo.edu, 419-530-3884

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pvic

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Fabrication Services Ìý
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Deposition of semiconductor materials, including:
Hydrogenated amorphous silicon (a-Si:H)
Nano crystalline silicon (nc-Si)
Hydrogenated nano-crystalline silicon (nc-Si:H)
Polycrystalline silicon (poly-Si)
Cadmium telluride (CdTe)
Cadmium sulfide (CdS)
Copper indium gallium selenide (CIGS)
Organo-metal halide perovskite
Cadmium selenide (CdSe)
Zinc telluride (ZnTe)
Iron sulfide (FeS2)
Lead sulfide (PbS)

Deposition of transparent conducting oxides (TCOs), including:
Indium tin oxide (ITO)
Aluminum doped zinc oxide (ZnO:Al)
Cadmium stannate (Cd2SnO4)

Deposition of buffer materials, including:
Zinc oxide (ZnO)
Tin oxide (SnO2)
Titanium oxide (TiO2)
Aluminum oxide (Al2O3)
Silicon oxide (SiO2)
Molybdenum oxide (MoO3)
Magnesium zinc oxide (MZO)

Deposition of Metals, including:
Copper (Cu)
Gold (Au)
Silver (Ag)
Aluminum (Al)
Nickel (Ni)
Molybdenum (Mo)

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Deposition Process Ìý
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Plasma chemical vapor deposition
Physical vapor deposition
Sputtering
Dual ion beam deposition
Spin, dip, and spray deposition of nanoparticles and nanoparticle precursors

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Supportive Processes Ìý
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Differential Scanning Calorimetry
Glove-boxes for handling samples in inert atmospheres
Laser Scribing
Nanomaterial's synthesis
Preparation of grid lines – lithography
Thermal gravimetric analysis
Thermal processing
Toxic gases are monitored and instruments are interlocked with fire alarm system for additional safety

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Fabrication Services Pricing Equipment Category ***Per Hour Ìý Requirement Ìý
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Annealing Oven Sample Treatment ** Ìý * Ìý
Balances Sample Prep, Treatment ** Ìý Ìý Ìý
Bath Sonicators Sample Prep, Treatment ** Ìý Ìý Ìý
Carbon Nanotube Separation Sample Prep $50 Ìý * Ìý
CdCl deposition Sample Post Treatment $50 Ìý * Ìý
CdTe Linear Sputtering Tool Deposition $200 Ìý * Ìý
Centrifuge Materials Post Treat/Prep $50 Ìý Ìý Ìý
Cyclic Voltammetry/Electrochemistry Deposition $50 Ìý Ìý Ìý
DI/ Ultrasonic/ Glass cleaning Sample Prep ** Ìý Ìý Ìý
Drying Ovens Sample Treatment ** Ìý Ìý Ìý
Electron Beam Evaporator Deposition $80 Ìý * Ìý
Glove Boxes Sample Prep, Deposition, Storage $50 Ìý * Ìý
Glove Boxes (triple w/ ebeam evaporator) Sample Prep, Deposition, Storage $150 Ìý * Ìý
Laser Scriber Sample Post Treatment $170 Ìý * Ìý
Metal RF/DC Magnetron Sputter Deposition $170 Ìý * Ìý
Nanotube Laser Synthesis Materials Synthesis $170 Ìý * Ìý
NIMA Dip-Coater Deposition $60 Ìý * Ìý
One dimensional Spray System Deposition $50 Ìý Ìý Ìý
Photolithography in clean room Suss MJB3 Mask Allinger Pattern Transfer $50 Ìý Ìý Ìý
Plasma Deposition System Deposition $170 Ìý * Ìý
Schlenk Line Materials Synthesis $50 Ìý * Ìý
Research / Pilot Deposition System with insitu monitoring Deposition $750 Ìý * Ìý
Spin coater Deposition $50 Ìý * Ìý
TCO RF/DC Magnetron Sputter Deposition $170 Ìý * Ìý
Thermal Evaporator (Denton) Deposition $50 Ìý Ìý Ìý
Two dimensional Spray System Deposition $50 Ìý * Ìý
Ultra sonic probe sonicator Sample Prep $50 Ìý * Ìý
Ultra-Centrifuge (90K RPM) Materials Treatment/Sample Prep $180 Ìý Ìý Ìý
Utility Sputter (custom built by Dr. Collins) Deposition $170 Ìý * Ìý
Vacuum Filtration Sample Prep $50 Ìý Ìý Ìý
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* Services will require faculty collaboration or PVIC supervision of use
** Incidental lab instrumentation or equipment included in main process cost
*** Lab entrance fees may be applied in addition to instrumentation and equipment costs
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Metrology Services Ìý
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Optical Analysis Ìý
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A PVIC strength is the ability to measure optical properties in real time using Spectroscopic Ellipsometry.
In addition to these real-time measurements, the following capabilities are available to measure optical properties:
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Ultraviolet-visible versus Near-infrared (UV-Vis-NIR) optical absorption
Steady-state and time resolved photoluminescence and spectroscopy
UV-Vis-NIR spectroscopic Ellipsometry, real time and ex situ modes
Photoluminescence and I/V surface mapping
Mid-IR transmission and reflectance spectroscopy and spectroscopic Ellipsometry
Broadband (UV to mid-IR) transient absorption spectroscopy
Imaging and Structure Analysis
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Structure Analysis Ìý
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UT has established several centers devoted to imaging and structure analysis in addition to those located at the PVIC research locations. All of the capabilities listed below are available for use: Ìý
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Atomic Force Microscopy
Raman spectroscopy
Scanning Confocal Microscopy
Scanning Electron Microscopy with energy dispersive X-ray spectroscopy
X-ray diffraction
Transmission Electron Microscopy
Depth Profiling Auger Electron Spectroscopy
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Metrology Services Pricing Equipment Category ***Per Hour Ìý Required
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AccuMap Ellipsometer Materials Characterization $170 Ìý *
ARTA (attachment to 1050) Materials Characterization $170 Ìý *
Auger Electron Spectroscopy Materials Characterization $75 Ìý Ìý
Cyclic Voltammetry/Electrochemistry Materials / Device Char ** Ìý Ìý
Dektak 150 Profilometer Surface / Thickness Char $25 Ìý Ìý
Fourier Transform Infra Red Spectroscopy Materials Characterization ** Ìý Ìý
IR-Vase Ellipsometer Materials Characterization $170 Ìý *
IV Solar Simulator Device Characterization $50 Ìý Ìý
Lambda 1050 Spectrophotometer Materials Characterization $80 Ìý Ìý
Laser Beam Induced Current/Voltage Device Characterization $170 Ìý *
Leak Detector System Characterization $50 Ìý *
Optical Microscope Surface Characterization ** Ìý Ìý
Quantum Efficiency Device Characterization $50 Ìý Ìý
Raman Spectroscopy/Photoluminescence excitation mapping Materials Characterization $170 Ìý *
Signatone 4-point probe Electrical Characterization ** Ìý Ìý
Steady State Photoluminescence Materials Characterization $50 Ìý *
Temperature Programmed Desorption Materials Characterization $50 Ìý Ìý
Thermogravimetric analysis Materials Characterization $50 Ìý Ìý
Time Resolved Photoluminescence Materials Characterization $125 Ìý *
Ultrafast Laser Spectroscopy Materials Characterization $200 Ìý *
Veeco Atomic Force Microscope Materials Characterization $80 Ìý Ìý
V-Vase Ellipsometer SurfaceÌýCharacterization $170 Ìý *
AccuMap Ellipsometer Materials Characterization $170 Ìý *
Solar Simulator Table Device Characterization $50 Ìý Ìý
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* Services will require faculty collaboration or PVIC supervision of use
** Incidental lab instrumentation or equipment included in main process cost
*** Lab entrance fees may be applied in addition to instrumentation and equipment costs

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Solar Panel Testing Services Ìý
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PVIC through various funding sources, including NASA, has equipped a robust panel testing facility that is augmented by additional instruments, for testing smaller scale devices and cells, at other UT laboratories. The following is a list of testing equipment available: Ìý
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Accelerated life testing at one sun equivalent and elevated temperature
Cell current, voltage (I/V) and efficiency testing with small area solar simulator
Environmental and weatherization
Inert atmosphere quantum efficiency and I/V
Large area 1.1 m x 1.5 m off-line thin film materials mapping for thickness, index of refraction, and extinction coefficient determination
Laser beam induced current mapping spectroscopy
Module-scale current-voltage (I/V) testing with large area solar simulator
Online thin-film materials mapping designed for glass panel conveyer line
Voltage breakdown
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Solar Testing Services Pricing Ìý Ìý Ìý Ìý Ìý Ìý Ìý Ìý Ìý Ìý Ìý Ìý Ìý Ìý Ìý Ìý Ìý Ìý Ìý Ìý Ìý Ìý Ìý Ìý Ìý Ìý Ìý Ìý Equipment CategoryÌý ***Per Hour Ìý Required
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AccuMap Ellipsometer Ìý Ìý Ìý Ìý Ìý Ìý Ìý Ìý Ìý Ìý Ìý Ìý Ìý Ìý Ìý Ìý Ìý Ìý Ìý Ìý Ìý Ìý Ìý Ìý Ìý Ìý Ìý Ìý Materials Characterization $170 Ìý *
Solar Simulator Table Ìý Ìý Ìý Ìý Ìý Ìý Ìý Ìý Ìý Ìý Ìý Ìý Ìý Ìý Ìý Ìý Ìý Ìý Ìý Ìý Ìý Ìý Ìý Ìý Ìý Ìý Ìý Ìý Device Characterization $50 Ìý Ìý
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* Services will require faculty collaboration or PVIC supervision of use
** Incidental lab instrumentation or equipment included in main process cost
*** Lab entrance fees may be applied in addition to instrumentation and equipment costs